Aihara group preprints
2003
- H.Tajima, H.Aihara, T.Higuchi, H.Kawai, T.Nakadaira, J.Tanaka, T.Tomura, M.Yokoyama et al.
Proper-time Resolution Function for Measurement of Time Evolution of B Mesons at the KEK B-Factory
Submitted to Nucl. Instr. and Meth. A
[ PDF ]
hep-ex/0301026 :
Abstract and
Postscript
from Los Alamos
- H.Aihara, M.Iwasaki and K.Tanabe
Study of Backgrounds at JLC IR
Presented at the International Workshop on
Linear Colliders (LCWS2002)
hep-ex/0303015 :
Abstract and
Postscript
from Los Alamos
- M.Iwasaki
Full Simulation Studies of the Silicon Tracker
for the Linear Collider Detector
Presented at the International Workshop on
Linear Colliders (LCWS2002)
hep-ex/0303017 :
Abstract and
Postscript
from Los Alamos
2001
- J. Tanaka, Measurements of Charmed Meson Lifetimes and Search for $D^0$-$\overline{D}^0$ Mixing with the Belle Experiment
Proceedings of BCP4, Feb.19-23, 2001, Ise-Shima, Japan
[ Postscript ]
2000
- H. Aihara, PHYSICS RESULTS FROM BELLE
Proceedings of 3rd international conference of B physics and CP violation
[ Postscript ]
- H. Aihara, The Belle Silicon Vertex Detector
Proceedings of 4th Internal Symposium on Development and Application of Semiconductor Tracking Detectors, Mar22-25, 2000, Hiroshima
[ Postscript |
PDF ]
- M.Yokoyama, Test results of VA1 fabricated by sub-micron technology
Proceedings of 4th Internal Symposium on Development and Application of Semiconductor Tracking Detectors, Mar22-25, 2000, Hiroshima
[ Postscript |
PDF ]
- H. Tajima, MEASUREMENTS OF HEAVY MESON LIFETIMES WITH BELLE
Proceedings of XXXth International Conference on High Energy Physics, Jul.27-Aug.2, 2000, Osaka
[ Postscript |
PDF ]
- H. Aihara, A MEASUREMENT OF CP VIOLATION IN B^0 MESON DECAYS AT BELLE
Proceedings of XXXth International Conference on High Energy Physics, Jul.27-Aug.2, 2000, Osaka
[ Postscript |
PDF ]
- J. Tanaka, MEASUREMENT OF CHARMED MESON LIFETIMES WITH BELLE
Proceedings of DPF2000, Aug.9-12, 2000, Columbus, Ohio
[ Postscript ]
- M.Yokoyama et al., Radiation-hardness of VA1 with Sub-micron Process Technology
Proceedings of IEEE Nuclear Science Symposium, Oct 15-20, 2000, Lyon
[ PDF ]
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