Aihara group preprints

2003

• H.Tajima, H.Aihara, T.Higuchi, H.Kawai, T.Nakadaira, J.Tanaka, T.Tomura, M.Yokoyama et al.
  Proper-time Resolution Function for Measurement of Time Evolution of B Mesons at the KEK B-Factory
  Submitted to Nucl. Instr. and Meth. A [ PDF ]
  hep-ex/0301026 : Abstract and Postscript from Los Alamos

• H.Aihara, M.Iwasaki and K.Tanabe
  Study of Backgrounds at JLC IR
  Presented at the International Workshop on Linear Colliders (LCWS2002)
  hep-ex/0303015 : Abstract and Postscript from Los Alamos

• M.Iwasaki
  Full Simulation Studies of the Silicon Tracker for the Linear Collider Detector
  Presented at the International Workshop on Linear Colliders (LCWS2002)
  hep-ex/0303017 : Abstract and Postscript from Los Alamos

2001

• J. Tanaka, Measurements of Charmed Meson Lifetimes and Search for $D^0$-$\overline{D}^0$ Mixing with the Belle Experiment
  Proceedings of BCP4, Feb.19-23, 2001, Ise-Shima, Japan [ Postscript ]

2000

• H. Aihara, PHYSICS RESULTS FROM BELLE
  Proceedings of 3rd international conference of B physics and CP violation [ Postscript ]

• H. Aihara, The Belle Silicon Vertex Detector
  Proceedings of 4th Internal Symposium on Development and Application of Semiconductor Tracking Detectors, Mar22-25, 2000, Hiroshima [ Postscript | PDF ]

• M.Yokoyama, Test results of VA1 fabricated by sub-micron technology
  Proceedings of 4th Internal Symposium on Development and Application of Semiconductor Tracking Detectors, Mar22-25, 2000, Hiroshima [ Postscript | PDF ]

• H. Tajima, MEASUREMENTS OF HEAVY MESON LIFETIMES WITH BELLE
  Proceedings of XXXth International Conference on High Energy Physics, Jul.27-Aug.2, 2000, Osaka [ Postscript | PDF ]

• H. Aihara, A MEASUREMENT OF CP VIOLATION IN B^0 MESON DECAYS AT BELLE
  Proceedings of XXXth International Conference on High Energy Physics, Jul.27-Aug.2, 2000, Osaka [ Postscript | PDF ]

• J. Tanaka, MEASUREMENT OF CHARMED MESON LIFETIMES WITH BELLE
  Proceedings of DPF2000, Aug.9-12, 2000, Columbus, Ohio [ Postscript ]

• M.Yokoyama et al., Radiation-hardness of VA1 with Sub-micron Process Technology
  Proceedings of IEEE Nuclear Science Symposium, Oct 15-20, 2000, Lyon [ PDF ]

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